As the output value of semiconductor fabs increases and their expansion accelerates, factories face massive information management and equipment maintenance challenges. This makes automated maintenance and intelligent shift management particularly crucial.

This article describes the digital transformation of large semiconductor wafer fabs' Voltage Sag Event Platform and Facilities Infrared Thermal Imaging (IR-SCAN) inspection methods. Considering the cybersecurity risks that digital technology might bring, security protection equipment (Gatekeeper) has been added at the network boundaries to enhance information security.

In recent years, large semiconductor fabs have successively expanded into overseas plants in Europe, America, and Japan, facing the problem of integrating voltage sag information across domestic and international sites. To overcome these limitations, a new platform has been developed to connect voltage sag information from various fabs, achieving big data integration. This platform automatically consolidates fab data during voltage sags and promptly notifies all fabs of voltage sag information, enabling a joint defense for shift operations.

With the increase in power-consuming equipment, facilities departments perform infrared thermal imaging inspections annually, with the number of inspection points reaching up to 500,000. This still requires significant human effort for interpretation, which is time-consuming and labor-intensive. Therefore, an image recognition model is used for detection, introducing artificial intelligence (AI) visual image recognition technology. The recognition speed can reach 0.72 seconds per image, automating labor-intensive tasks intelligently.